Kai Shi Mai KM series large field image flash tester, high-precision measuring instrument, five in one batch testing

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Kai Shi Mai KM series large field image flash tester, high-precision measuring instrument, five in one batch testing

$42857.14 ~ 85714.29

Reference Price

1platform (Min. Order)

price range

highest price

$42857.14

lowest price

$85714.29

Ship From

Shanghai, Shanghai

Shipping

To be negotiated with the supplier

Customization

For customization requests, please

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Brand

Kaishi Mai

Is it imported

Operation method

fully automatic

precision

Submicron scale

Application

Integrated automated detection

Application Industry

semiconductor

Function

Defect Detection

Advantage

Rich modules

Microscopic Strength

Global display of microscopic morphological features

Ambient temperature

5°~40°

Field of vision

Wide field of vision

color

black

Place of Origin

China

Product Name

Fully automatic image measuring instrument

Probe measurement

Support

Advantage 1

ultra-high precision

Advantage 2

Ultra large measurement range

Advantage 3

Sub-pixel algorithm

Advantage 4

High resolution dual telecentric lens

Probe switching

automatic

XY platform load

8kg

Flash Test

Support

Batch measurement

Support

Details

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